图书情报工作 ›› 2013, Vol. 57 ›› Issue (18): 104-109.DOI: 10.7536/j.issn.0252-3116.2013.18.018

• 情报研究 • 上一篇    下一篇

利用Innography进行专利情报分析——以OLED为例

战玉华, 潘乐影, 程爱平   

  1. 清华大学图书馆
  • 收稿日期:2013-04-19 修回日期:2013-09-02 出版日期:2013-09-20 发布日期:2013-09-20
  • 作者简介:战玉华,清华大学图书馆馆员,E-mail:zhanyh@lib.tsinghua.edu.cn;潘乐影,清华大学图书馆助理馆员;程爱平,清华大学图书馆副研究馆员。

Patents Analysis by Innography:Taking OLED as an Example

Zhan Yuhua, Pan Leying, Cheng Aiping   

  1. Tsinghua University Library, Beijing 100084
  • Received:2013-04-19 Revised:2013-09-02 Online:2013-09-20 Published:2013-09-20

摘要: 指出作为众多专利分析工具中的一种,Innography具有专利检索、统计分析及核心专利挖掘等功能。以典型课题有机发光二极管(OLED)为例,探索Innography在专业情报分析中的价值,阐述如何利用Innography获取全球专利信息,利用专利强度指标挖掘核心专利,对相关专利进行统计分析,得出科学的结论。总结Innography的特点及不足,强调专利情报分析必须准确和全面。

关键词: 专利分析, Innography, 有机发光二极管, OLED

Abstract: Patents are important literatures for scientific research and information analysis. As one of patent analysis tools, Innography has many functions such as patent retrieval, patent analysis and core patent digging. Taking organic light-emitting diode (OLED) as an example, this paper explores the value of Innography in professional information analysis and illustrates how to obtain global patents, dig core patents by patent strength index and make scientific conclusions by analysis with Innography. This paper finally summarizes the characteristics and shortcomings of Innography, emphasizing that patent analysis must be accurate and comprehensive.

Key words: patent analysis, Innography, organic light-emitting diode, OLED

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