图书情报工作

图书情报工作 >

2023 , Vol. 67 >Issue 21: 89 - 99

DOI: https://doi.org/10.13266/j.issn.0252-3116.2023.21.009

情报研究

融合美国商业管制清单和专利的技术链关键路径识别研究——以EDA软件领域为例

  • 朱宇婧 ,
  • 陈芳 ,
  • 赵萍 ,
  • 王学昭
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  • 1. 中国科学院文献情报中心 北京 100190;
    2. 中国科学院大学经济与管理学院信息资源管理系 北京 100190
朱宇婧,硕士研究生;陈芳,副研究馆员,硕士;赵萍,副研究员,硕士

收稿日期: 2023-04-21

  修回日期: 2023-07-26

  网络出版日期: 2023-11-27

基金资助

中国科学院文献情报能力建设专项“面向决策应用的智能情报分析模型研究”(项目编号:E2290433)和中国科学院战略研究专项“‘两个清单’编制、动态更新等研究支撑”(项目编号:GHJ-ZLZX-2023-19)研究成果之一

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Critical Path Identification in Technology Chain by Integrating the U.S. Commerce Control List and Patents: An Example from the EDA Software Field

  • Zhu Yujing ,
  • Chen Fang ,
  • Zhao Ping ,
  • Wang Xuezhao
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  • 1. National Science Library, Chinese Academy of Sciences, Beijing 100190;
    2. Department of Information Resources Management, School of Economics and Management, University of Chinese Academy of Sciences, Beijing 100190

Received date: 2023-04-21

  Revised date: 2023-07-26

  Online published: 2023-11-27

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摘要

[目的/意义] 在美国对华技术出口管制日益升级的背景下,本研究提出一种在专利引文网络中融合美国商业管制清单数据识别关键路径的方法,尝试寻求技术突破或技术替代方案,该方法具有较高实际应用价值。[方法/过程] 在专利引文网络中融合商业管制清单数据,在路径组合权重中引入管制权重以衡量技术受到管制的程度,引入语义权重提高路径技术主题一致性;采用动态规划的广度优先搜索网络获得组合权重最大的路径集合;根据路径上所有专利的平均语义将候选关键路径进行聚类,选择各个类中组合权重最大的路径作为不同技术环节上的关键路径。[结果/结论] 在EDA软件技术领域的实证结果表明,该方法能够识别领域内5个不同技术环节上受到管制的关键路径,并通过对比引入管制权重前后的结果探讨管制权重在该方法中的重要作用。

关键词： 关键路径识别; 商业管制清单; 专利引文网络; EDA

本文引用格式

朱宇婧 , 陈芳 , 赵萍 , 王学昭 . 融合美国商业管制清单和专利的技术链关键路径识别研究——以EDA软件领域为例[J]. 图书情报工作, 2023 , 67(21) : 89 -99 . DOI: 10.13266/j.issn.0252-3116.2023.21.009

Abstract

[Purpose/Significance] This paper proposes a method of identifying critical paths in patent citation networks by integrating the U.S. Commerce Control List（CCL） in response to the mounting U.S. technology export controls on China with the aim of technological breakthroughs or alternatives. The method has high practical value.[Method/Process] The method combined CCL data into the patent citation network and introduced control weight to measure the degree of technology control, which also using semantic weight to improve the consistency of technology topics in the path combination weight. The method also employed dynamic programming and breadthfirst search network to obtain the path with the maximum combination weight. Then, candidate critical paths were clustered based on the average semantics of all patents on the path, and the path with the maximum combination weight in each cluster was chosen as the representative of the critical path on different technology segments. [Result/Conclusion] The empirical results in the EDA software technology field demonstrate that the method can identify critical paths subject to technology controls in five different technology segments. The importance of control weight in this method has been explained by comparing the results before and after the control weight introduction.

Key words： critical path identification; Commerce Control List; patent citation network; EDA

参考文献

[1] Bureau of Industry and Security. Entity list[EB/OL].[2023-09-13]. https://www.bis.doc.gov/index.php/policy-guidance/lists-ofparties-of-concern/entity-list.
[2] Bureau of Industry and Security. Commerce Control List(CCL)[EB/OL].[2023-09-13]. https://www.bis.doc.gov/index.php/regulations/commerce-control-list-ccl.
[3] BRESCHI S, LISSONI F. Knowledge networks from patent data[M]//MOED H F, GLÄNZEL W, SCHMOCH U. Handbook of quantitative science and technology research:the use of publication and patent statistics in studies of S&T systems.Dordrecht:Springer, 2005:613-643.
[4] XU Y S, HUA X F. Mapping technological trajectories as patent citation networks:taking the aero-engine industry as an example[C]//2014 Portland international conference on management of engineering&technology. Kanazawa:IEEE,2014:2827-2835.
[5] 远德玉.产业技术界说[J].东北大学学报(社会科学版),2000(1):22-25.(YUAN D Y. Industrial technology definition[J]Journal of Northeastern University(social science), 2000(1):22-25.)
[6] 王发明,毛荐其.技术链、产业技术链与产业升级研究——以我国半导体照明产业为例[J].研究与发展管理, 2010,22(3):19-28.(WANG F M, MAO J Q. A study on technological chain, industry technological chain and industry upgrading:a case study on semiconductor illuminance industry in China[J].R&D management, 2010, 22(3):19-28.)
[7] 黄鲁成,杨学君.新兴技术与新兴产业协同演化规律探析[J].科技进步与对策, 2014, 31(3):72-78.(HUANG L C, YANG X J. Exploring the law of collaborative evolution between emerging technologies and emerging industries[J]. Science&technology progress and policy, 2014, 31(3):72-78.)
[8] 高汝熹,纪云涛,陈志洪.技术链与产业选择的系统分析[J].研究与发展管理, 2006(6):95-101.(GAO R X, JI Y T, CHEN Z H. Technology chain and the systemic analysis on the industrial selection[J]. R&D management, 2006(6):95-101.)
[9] 方思,李国秋.全球无人驾驶汽车专利分析——从产业链和技术链的二维角度[J].竞争情报, 2016, 12(5):27-36.(FANG S, LI G Q. Patent analyze of globe driverless cars:from the perspective of industry chain and technology chain[J].Competitive intelligence, 2016, 12(5):27-36.)
[10] 袁晓东,鲍业文.“中兴事件”对我国产业发展的启示:基于专利分析[J].情报杂志, 2019, 38(1):23-29.(YUAN X D,BAO Y W. The enlightenment of “ZTE denial order” incident to China’s industrial development:based on patent analysis[J].Journal of intelligence, 2019, 38(1):23-29.)
[11] 任海英,李真.基于输入输出型SAO网络的核心技术链识别方法研究——以量子计算领域为例[J].图书情报工作, 2021,65(19):117-129.(REN H Y, LI Z. Research on identification method of core technology chain based on an input-output SAO network:a case of quantum computing technologies[J]. Library and information service, 2021, 65(19):117-129.)
[12] 戚筠,唐恒,石俊国.基于小世界网络特性的核心技术识别研究——以石墨烯为例[J].情报杂志, 2020, 39(2):50-55.(QI Y, TANG H, SHI J G. Research on core technology identification based on small world network characteristics:a case study of graphene[J]. Journal of intelligence, 2020, 39(2):50-55.)
[13] 王林娜,王丽,招阳,等.从一个实际案例的检索浅谈CPC分类体系[J].中国发明与专利, 2014(8):90-93.(WANG L N,WANG L, ZHAO Y, et al. Discussion on CPC classification system from a practical case search[J]. China invention&patent, 2014(8):90-93.)
[14] 温亮,邱鹏君,马萍萍,等.基于SAO语义分析的潜在技术合作伙伴识别[J].北京理工大学学报(社会科学版),2017, 19(4):91-96.(WEN L, QIU P J, MA P P, et al. Potential technology partner identification by using SAO semantic analysis[J]. Journal of Beijing Institute of Technology(social sciences edition), 2017, 19(4):91-96.)
[15] 杨张博,高山行.基于SNA的生物技术产业集群技术结构研究——以波士顿集群为例[J].科学学研究, 2013,31(9):1338-1346,1354.(YANG Z B, GAO S X. Study on biotechnology industry cluster technology structure through SNA, Boston cluster as an example[J]. Studies in science of science, 2013, 31(9):1338-1346,1354.)
[16] 陈峰.应对国外对华技术出口限制的竞争情报问题分析[J].情报杂志, 2018, 37(1):9-13,33.(CHEN F. On competitive intelligence problems about combating foreign technology export control against China[J]. Journal of intelligence, 2018, 37(1):9-13,33.)
[17] 韩爽.美国出口管制从关键技术到新兴和基础技术的演变分析[J].情报杂志, 2020, 39(12):33-39.(HAN S. Analysis on the evolution of US export control from critical technologies to emerging and foundational technologies[J]. Journal of intelligence, 2020, 39(12):33-39.)
[18] 李广建,王锴,张庆芝.基于多源数据的美国出口管制分析框架及其实证研究[J].数据分析与知识发现, 2020, 4(9):26-40.(LI G J, WANG K, ZHANG Q Z. Analysis framework based on multi-source data for US export control:an empirical study[J].Data analysis and knowledge discovery, 2020, 4(9):26-40.)
[19] 袁钺,庞娜,李广建.美国《商业管制清单》中技术指标自动抽取研究[J].数据分析与知识发现, 2023, 7(1):35-48.(YUAN Y, PANG N, LI G J. Automatically extracting technical indicators from U.S. Commerce Control List[J]. Data analysis and knowledge discovery, 2023, 7(1):35-48.)
[20] 祝捷频,赵蕴华.基于美国对华技术管制清单的专利分析——以数控系统领域为例[J].情报杂志, 2014, 33(11):46-53.(ZHU J P, ZHAO Y H. Patent analysis based on technical control list:the case of CNC technology[J]. Journal of intelligence, 2014, 33(11):46-53.)
[21] 陈芳,沈湘,王学昭,等.基于出口管制清单的质谱仪技术对比分析研究[J].世界科技研究与发展, 2023, 45(2):210-220.(CHEN F, SHEN X, WANG X Z, et al. Comparative analysis on mass spectrometer technology based on export control[J]. World sci-tech R&D, 2023, 45(2):210-220.)
[22] 吕璐成,韩涛,陈芳,等.美国商业管制清单与专利自动映射方法及实证研究[J].情报学报, 2022, 41(1):50-61.(LYU L C, HAN T, CHEN F, et al. Automatic mapping method and empirical research of U.S. Commerce Control List data and patent data[J]. Journal of the China Society for Scientific and Technical Information, 2022, 41(1):50-61.)
[23] LIU J S, LU L Y Y. An integrated approach for main path analysis:development of the Hirsch index as an example[J].Journal of the American Society for Information Science and Technology, 2012, 63(3):528-542.
[24] BATAGELJ V, MRVAR A. Pajek:analysis and visualization of large networks[M]//JÜNGER M, MUTZEL P. Graph drawing software. Berlin:Springer, 2004:77-103.
[25] CHEN L, XU S, ZHU L, et al. A semantic main path analysis method to identify multiple developmental trajectories[J]. Journal of informetrics, 2022, 16(2):101281.
[26] 陈亮,杨冠灿,张静,等.面向技术演化分析的多主路径方法研究[J].图书情报工作, 2015, 59(10):124-130,115.(CHEN L,YANG G C, ZHANG J, et al. Research on multiple main paths method oriented to analysis of technological evolution[J]. Library and information service, 2015, 59(10):124-130,115.)
[27] RODRIGUEZ A, LAIO A. Clustering by fast search and find of density peaks[J]. Science, 2014, 344(6191):1492-1496.
[28] Siemens. Electronic design automation[EB/OL].[2023-09-13].https://www.plm.automation.siemens.com/global/en/our-story/glossary/electronic-design-automation-eda/95805.
[29] Synopsys. What is electronic design automation(EDA)? How it works[EB/OL].[2023-09-13]. https://www.synopsys.com/glossary/what-is-electronic-design-automation.html.
[30] STROUD C E, WANG L T, CHANG Y W. Chapter 1-Introduction[M]//WANG L T, CHANG Y W, CHENG K T(TIM).Electronic design automation. Boston:Morgan Kaufmann, 2009:1-38.
[31] Bureau of Industry and Security. Implementation of certain2021 Wassenaar arrangement decisions on four section 1758technologies[EB/OL].[2023-09-13]. https://www.federalregister.gov/documents/2022/08/15/2022-17125/implementation-ofcertain-2021-wassenaar-arrangement-decisions-on-four-section-1758-technologies.
[32] Bureau of Industry and Security. Implementation of additional export controls:certain advanced computing and semiconductor manufacturing items; supercomputer and semiconductor end use; entity list modification[EB/OL].[2023-09-13]. https://www.federalregister.gov/documents/2022/10/13/2022-21658/implementation-of-additional-export-controls-certain-advancedcomputing-and-semiconductor.
[33] LIU J S, KUAN C H. A new approach for main path analysis:decay in knowledge diffusion[J]. Journal of the Association for Information Science and Technology, 2016, 67(2):465-476.
[34] 陈芳,王学昭,刘细文,等.美国出口管制科学仪器技术分类研究[J].世界科技研究与发展, 2022, 44(3):287-298.(CHEN F, WANG X Z, LIU X W, et al. Research on classification of scientific instruments and technologies in the Commerce Control List of US export control[J]. World sci-tech R&D, 2022, 44(3):287-298.)
[35] BATAGELJ V. Efficient algorithms for citation network analysis[J]. arXiv preprint cs/0309023, 2003.
[36] 马旭,张胜恩,潘毅华,等.计算光刻研究及进展[J].激光与光电子学进展, 2022, 59(9):122-170.(MA X, ZHANG S E, PAN Y H, et al. Research and progress of computational lithography[J].Laser&optoelectronics progress, 2022, 59(9):122-170.)
[37] 张波.测试芯片自动化设计与集成电路成品率提升研究[D].杭州:浙江大学, 2012.(ZHANG B. Research on test chip layout automation and yield improvement of integrated circuit[D]. Hangzhou:Zhejiang University, 2012.)
[38] 杨伟,李儒章.基于Cadence界面的工艺设计包设计方法[J].微电子学, 2005(5):504-508.(YANG W, LI R Z. Design procedure using cadence based process design kit[J]. Microelectronics,2005(5):504-508.)
[39] 杨海钢,孙嘉斌,王慰. FPGA器件设计技术发展综述[J].电子与信息学报, 2010, 32(3):714-727.(YANG H G, SUN J B,WANG W. An overview to FPGA device design technologies[J].Journal of electronics&information technology, 2010, 32(3):714-727.)
[40] MALIK J, OJHA A. Design of a VLSI FPGA integrated circuit[C]//Proceedings of the 2005 IEEE region 5 and IEEE denver section technical, professional and student development workshop. Boulder:IEEE, 2005:12-15.
[41] 张永光.芯片设计中的可测试性设计技术[D].杭州:浙江大学, 2005.(ZHANG Y G. Design for testability technology in chip design[D]. Hangzhou:Zhejiang University, 2005.)
[42] DEVLIN J, CHANG M W, LEE K, et al. BERT:pre-training of deep bidirectional transformers for language understanding[J].arXiv preprint arXiv:1810.04805, 2018.
[43] LEE J S, HSIANG J. PatentBERT:patent classification with fine-tuning a pre-trained BERT model[J]. arXiv preprint arXiv:1906.02124, 2019.
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