利用Innography进行专利情报分析——以OLED为例
战玉华, 潘乐影, 程爱平
Patents Analysis by Innography:Taking OLED as an Example
Zhan Yuhua, Pan Leying, Cheng Aiping
图书情报工作 . 2013, (18): 104 -109 .  DOI: 10.7536/j.issn.0252-3116.2013.18.018