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Research on Patent Maintenance and Its Influencing Factors in the Field of Information Technology
Received date: 2013-08-18
Revised date: 2013-09-06
Online published: 2013-09-20
This paper discusses the applicability and effectiveness when survival analysis is applied to the study of patent maintenance. The authors investigate the entire invention patents of China in information technology field from 1985 to 2009 by using the survival function and stratified cox regression model, in order to determine its distribution of maintenance period and compare patent maintenance status between applicants from different countries and quantify the impact of risk factor. The results show that the median survival period in information technology field is approximately 10.5 year, only 1% patents maintain until expiration; The maintenance status of American applicants remains the best, while the overall maintenance period of Chinese applicants is the shortest with the exception that some patents keep the acceptance of market for a long time; The type of patent applicants, authorization year, the number of inventors, the number of applicants, and the page number of the application form influence patent maintenance in a successively decreasing way.
Song Shuang , Chen Xiangdong . Research on Patent Maintenance and Its Influencing Factors in the Field of Information Technology[J]. Library and Information Service, 2013 , 57(18) : 98 -103,132 . DOI: 10.7536/j.issn.0252-3116.2013.18.017
[1] 乔永忠.专利维持时间影响因素研究[J].科研管理,2011(7):143-144.
[2] O'Donoghue T, Scotchmer S, Thisse J F. Patent breadth, patent life, and the pace of technological progress[J]. Journal of Economics and Management Strategy, 1998, 7 (1): 1-32.
[3] 工业和信息化部科技司.2009年信息技术领域专利态势分析报告[J].电子知识产权,2009(12):19-30.
[4] Zeebroeck N V. Patents only live twice: A patent survival analysis of the determinants of examination lags, grant decisions, and renewals[EB/OL].[2013-02-20].http://www.epip.eu/conferences/epip03/papers/vanZeebroeck_pap_nvz_patentsurvival_v09_Sep08.pdf.Working Papers CEB,2007:10-15.
[5] Xie Ying, Giles D E. A survival analysis of the approval of US patent applications[EB/OL].[2012-11-15]. http://web.uvic.ca/econ/research/papers/ewp0707.pdf. Econometrics Working Paper EWP0707, 2007:18- 19.
[6] Pakes A, Simpson M. Patent renewal data[EB/OL].[2012-11-15]. http://www.brookings.edu/~/media/projects/bpea/1989%20micro/1989_bpeamicro_pakes.pdf.Microeconomics,1989:331-410.
[7] William H B. Trends in patent renewals at the United States Patent and Trade Mark Office[J]. World Patent Information, 1995, 17(4): 225-234.
[8] Pakes A, Schankerman M. The rate of obsolescence of patents, research gestation lags, and the private rate of return to research resources[M]//R&D, Patents and Productivity. Chicago:The University of Chicago Press, 1984: 98- 112.
[9] Maurseth P B. Lovely but Dangerous: The Impact of Patent Citations on Patent Renewal[J].Economics of Innovation and New Technology, 2005(14):351-374.
[10] Svensson R. Licensing or acquiring patents? Evidence from patent renewal data[EB/OL].[2013-02-20].http://www.eea-esem.com/files/papers/EEA-ESEM/2007/900/Renewalmode4.pdf.
[11] 乔永忠.不同技术领域专利维持信息实证研究[J].图书情报工作,2011(6):36-39.
[12] 郑贵忠,刘金兰.基于生存分析的专利有效模型研究[J]. 科学学研究,2010(11):1677-1682.
[13] 黄蕾,张鹿,熊艳.基于专利有效性的光伏产业创新差异研究[J].情报杂志,2010(2):67-78.
[14] 彭非, 王伟.生存分析[M].北京:中国人民大学出版社,2005:3-6.
[15] 周江雄, 刘建华, 李颖芳. 生命表的构造理论[M].天津: 南开大学出版社, 2001: 3- 208.
[16] Ulrich Schmoch.Concept of a technology classification for country comparisons[R].Report to the World Intellectual Property Organization (WIPO),2008.
[17] 工业和信息化部科技司.2008年信息技术领域专利态势分析报告[J].电子知识产权,2008(12):14-18.
[18] 乔永忠.基于专利情报视角的专利维持时间影响因素分析[J].图书情报工作,2009,53(4):42-45.
[19] 宋爽.中国专利维持时间影响因素研究——基于专利质量的考量[J].图书情报工作,2013,57(7):96-100.
[20] Brusoni S,Crespi G,Francoz D,et al. Everything you always wanted to know about inventors(but never asked):Evidence from the PatVal-EU survey[EB/OL].[2013-03-05]. http://www.lem.sssup.it/WPLem/files/2005-20.pdf.Pisa:Laboratoy of Economics and Management,2006.
[21] Cox D R, Oakes D.Analysis of Survival Data[M]. London:Methuen,1984:185-190.
[22] Moore G E. Cramming more components onto integrated circuits[J]. Electronics, 1965(8):114-117.
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